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Thermal Shock

This test is used to determine the ability of components, equipment, or other products to withstand rapid changes in ambient temperature.

Test purpose
Evaluate the tolerance of components, equipment, or other products to rapid changes in ambient temperature, and detect performance degradation or failure of materials caused by thermal stress.

 

Test Standard
According to the standard:

IEC 60068-2-14: Environmental testing - Part 2: Test method N (temperature variation)

MIL-STD-202: Environmental Test Methods for Electronic and Electrical Components

GB/T 2423.22: Environmental testing for electrical and electronic products (temperature changes)

 

Test Principle
By quickly switching between high and low temperature environments, simulate the extreme temperature changes that the product may encounter during actual use or storage, and evaluate the performance stability of the product under thermal stress.

test equipment
Cold and hot shock test chamber (with fast temperature switching function)

 

Temperature Recorder

Sample holder

Assessment tools (microscopes, electrical performance testers, etc.)

Test steps
Sample preparation:

Clean the surface of the sample to ensure that there are no oil stains or other contaminants.

Record the initial state of the sample (taking photos, conducting electrical performance tests, etc.).

Fix the sample inside the test chamber and ensure that the exposed surface is uniformly heated.

 

Test condition settings:

High temperature limit: set according to demand (usually+85 ℃ to+150 ℃).

Low temperature limit: set according to demand (usually -40 ℃ to -65 ℃).

Residence time: Set according to requirements (usually 30 minutes to 1 hour).

Conversion time: Set according to requirements (usually less than 5 minutes).

Cycle times: Set according to demand (usually 50-100 times).

 

Test Run:

Start the test chamber and perform temperature cycling according to the set conditions.

Each cycle includes:

Quickly transfer the sample from the high-temperature chamber to the low-temperature chamber and maintain the residence time.

Quickly transfer the sample from the low-temperature chamber to the high-temperature chamber and maintain the residence time.

Repeat the above cycle until the set number of times is completed.

Test completed:

Take out the sample and restore it to a standard environment for 24 hours.

Record the status of the sample after testing (taking photos, conducting electrical performance tests, etc.).

 

Result evaluation:

Appearance inspection:

Check whether there are cracks, deformations, delamination, and other phenomena in the sample.

Electrical performance testing:

Evaluate the electrical performance changes of components (such as resistance, capacitance, insulation resistance, etc.).

Mechanical performance testing:

Evaluate the changes in properties such as tensile strength and impact strength of materials.

Microstructure analysis:

Observe surface microstructural changes using a microscope.

 

Precautions
Ensure accurate temperature switching speed and residence time of the test chamber to avoid deviation in testing conditions.

The sample should be placed evenly to avoid local overheating or overcooling.

After the test is completed, the sample needs to be restored to a standard environment before evaluation.

 

Test Record
Record the testing conditions (high temperature limit, low temperature limit, residence time, transition time, number of cycles, etc.).

Record the initial and post test states of the sample (taking photos, conducting electrical performance tests, etc.).

Record the specific manifestations of material performance changes.

 

Conclusion
Based on the test results, evaluate the product's resistance to cold and hot shock environments and issue a test report. Through this test, important basis can be provided for product design, material selection, and process improvement, ensuring the reliability of the product under extreme temperature changes.

6 individual

Large-scale experimental base

150 individual

Professional Lab

30 All kinds of

Analysis Method

8 million times

Testing/year