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Reset feature
Test the reset performance of the sample under different voltage dips. This experiment is applicable to devices with reset function (such as those equipped with one or more microcontroller devices). Further determine whether the functional status of the sample meets the design requirements.
Objective of the experiment
The purpose of this experiment is to test the reset performance of devices with reset function (such as devices equipped with microcontrollers) under different voltage sag conditions. By simulating voltage dips, evaluate the reset behavior of equipment under transient voltage changes to ensure that its functional status meets design requirements.
Experimental Background
Voltage dip is a common transient phenomenon in electrical systems, which may be caused by the following reasons:
Sudden start-up or shutdown of high-power loads.
Short circuit or malfunction of the power supply circuit.
Grid fluctuations or unstable generator output.
For devices with reset function (such as microcontrollers), voltage dips may cause the device to reset or malfunction. Therefore, it is necessary to test the reset performance of the equipment under voltage sag conditions to ensure its reliability in practical applications.
Experimental equipment
Device under Test (DUT): A device with reset function (such as a microcontroller system).
Programmable DC power supply: Simulate voltage dips (such as from 12V/24V to 5V/3V).
Voltage meter: monitors the amplitude and duration of voltage dips.
Ammeter: measures the current under voltage dips.
Oscilloscope: Monitor the waveform of voltage dips and device reset signals.
Load simulator: Simulate the load situation of the device in actual operation.
Reset signal monitor: monitors the reset signal of the device (such as the reset pin of the microcontroller).
Experimental Procedure
Device connection:
Connect the DUT to a programmable DC power supply.
Connect an ammeter in series and a voltmeter in parallel in a circuit to monitor current and voltage.
Connect an oscilloscope to monitor the waveform of voltage dips and device reset signals.
Connect the reset signal monitor to monitor the reset behavior of the device.
Initial testing:
Under normal operating conditions, record the working status of the DUT, including voltage, current, and functional performance.
Voltage sag simulation:
Use a programmable DC power supply to simulate voltage dips (such as from 12V/24V to 5V/3V, lasting for tens to hundreds of milliseconds).
Record the voltage, current, and operating status of the DUT under voltage dips.
Reset behavior monitoring:
Monitor the reset signal of the device and observe whether the device resets when there is a voltage drop.
Record the time of device reset, the waveform of the reset signal, and the recovery situation after reset.
Functional status verification:
After a voltage drop, check if the equipment can resume normal operation.
Record the functional status of the device after a voltage drop (such as data loss, program restart, etc.).
Multiple tests:
Repeat the test under different voltage dip conditions (such as different amplitudes and durations) to evaluate the reset performance of the equipment.
Data analysis:
Compare test data under different voltage sag conditions and analyze the reset behavior of the equipment.
Evaluate whether the reset performance of the device meets the design requirements.
Experimental precautions
safety first:
Voltage dips may cause impact on equipment, and protective measures should be taken to avoid equipment damage.
Ensure good ventilation in the experimental environment to avoid equipment overheating and causing fires.
Gradually adjust parameters:
When simulating voltage dips, the voltage amplitude and duration should be gradually adjusted to avoid equipment damage caused by transient high currents.
Real-time monitoring
During the experiment, real-time monitoring of voltage, current, and equipment status is required to promptly detect any abnormalities.
Reset signal monitoring:
Ensure that the reset signal monitor can accurately capture the device's reset behavior.
Experimental results and conclusions
Experimental results:
Record the reset behavior of the device under different voltage dips, including reset time, reset signal waveform, and recovery after reset.
Record the functional status of the device after a voltage drop.
Conclusion:
Evaluate the reset performance of the equipment under voltage sag conditions and confirm whether it meets the design requirements.
If the device reset is abnormal, analyze the cause and propose improvement suggestions.
If the device has an effective reset protection mechanism, confirm that it meets the design requirements.
experiment report
The experimental report should include the following contents:
Experimental objective: Briefly describe the objectives of the experiment.
Experimental equipment: List all the equipment used and their specifications.
Experimental steps: Detailed description of the experimental operation process.
Experimental data: Record all test data, including charts and waveforms.
Data analysis: Analyze experimental data to draw conclusions.
Conclusion and Suggestions: Summarize the experimental results and propose improvement suggestions.
Appendix: Typical Parameters of Voltage Drop
Voltage drop value:
12V system: Sudden drop from 12V to 5V-9V.
24V system: Sudden drop from 24V to 10V-18V.
Duration of voltage dip:
From tens of milliseconds to hundreds of milliseconds (such as 50ms, 100ms, 200ms).
Through this experiment, the reset performance of the device under voltage sag conditions can be verified, ensuring its normal operation or effective protection in practical applications.
Large-scale experimental base
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Analysis Method
Testing/year
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